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Infinitesima

Infinitesima develops atomic precision 3D metrology technology for semiconductor manufacturing, combining atomic force microscopy with high-speed measurement techniques.

Infinitesima, founded in 2001, develops atomic precision 3D metrology technology for the semiconductor manufacturing industry. The company operates at the intersection of atomic force microscopy, metrology, and 3D measurement, addressing the increasingly demanding precision requirements of advanced chip fabrication.

The company's Rapid Probe Microscope (RPM) represents a fundamentally different approach to nanoscale measurement. By combining atomic force microscopy with high-speed laser activation and interferometric accuracy, the RPM delivers picometer precision at speeds 100 times faster than conventional probe techniques. This capability is critical for inline semiconductor metrology, where both accuracy and throughput are essential.

Infinitesima's product portfolio also includes the Metron3D and RPM Scanner, both designed for atomic precision 3D metrology applications. The company's technology targets the semiconductor manufacturing vertical, where the need for precise 3D characterisation of increasingly complex device structures continues to grow.

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